| 000 | 01408cam a22003497a 4500 | ||
|---|---|---|---|
| 001 | 13401224 | ||
| 003 | AUCL | ||
| 005 | 20200729120735.0 | ||
| 008 | 031112s2003 enka b 001 0 eng | ||
| 010 | _a 2003277476 | ||
| 015 | _aGBA2-Z5021 | ||
| 020 | _a0521773563 | ||
| 035 | _a(OCoLC)ocm48784338 | ||
| 040 |
_aUKM _cAUCL _dTEF _dDLC |
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| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aTK7874.65 _b.J43 2003 |
| 082 | 0 | 4 |
_a621.38154 _221 _bJHA |
| 100 | 1 | _aJha, Niraj K. | |
| 245 | 1 | 0 |
_aTesting of digital systems _cN.K. Jha and S. Gupta. |
| 260 |
_aCambridge : _bCambridge University Press, _c2003. |
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| 300 |
_axvi, 1000 p. : _bill. ; _c26 cm. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aDigital integrated circuits _xTesting. |
|
| 700 | 1 |
_aGupta, S. _q(Sandeep), _d1962- |
|
| 856 | 4 | 1 |
_3Sample text _uhttp://www.loc.gov/catdir/samples/cam041/2003277476.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/cam041/2003277476.html |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/cam041/2003277476.html |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0732/2003277476-b.html |
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c25430 _d25430 |
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