000 00438nam a22001337a 4500
008 170623t xxu||||| |||| 00| 0 eng d
020 _a9781475781427
037 _c6908.00 PKR
100 _aBushnell, Michael L. ; Agrawal , Vishwani D.
_91723
245 _aEssentials of electronic testing for digital , memory & mixed-signal VLSI circuits
260 _aNew York
_bSpringer Science
_c2000.
300 _axviii; 690 p.
942 _2ddc
_cBK
999 _c11566
_d11566