Taur, Yuan <br/><br/>
Fundamentals of modern VLSI devices 

 - 3rd ed 
 - United Kingdom  Cambridge  2022 
 - xxvii, 597 pg 
<br/><br/>Include index 
<br/><br/><label>ISBN: </label>978-1-108-48002-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bands in silicon, Density of states, Diffusion current
<br/><br/><label>Dewey Class. No.: </label>621.395  / TAU-F