TY  - BOOK
AU  - Jha,Niraj K.
AU  - Gupta,S.
TI  - Testing of digital systems 
SN  - 0521773563
AV  - TK7874.65 .J43 2003
U1  - 621.38154 21
PY  - 2003///
CY  - Cambridge
PB  - Cambridge University Press
KW  - Digital integrated circuits
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/samples/cam041/2003277476.html
UR  - http://www.loc.gov/catdir/description/cam041/2003277476.html
UR  - http://www.loc.gov/catdir/toc/cam041/2003277476.html
UR  - http://www.loc.gov/catdir/enhancements/fy0732/2003277476-b.html
ER  -