Breakdown phenomena in semiconductors and semiconductor devices / (Record no. 1994)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01708nam a2200241 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | ASIN9812563954 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | AUCL |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20210902160504.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 120223s2005 xxu eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9812563954 (hardcover) |
| Terms of availability | $140.00 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9789812563958 (hardcover) |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | aui |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Michael E Levinshtein |
| 245 10 - TITLE STATEMENT | |
| Title | Breakdown phenomena in semiconductors and semiconductor devices / |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | [S.l.] : |
| Name of publisher, distributor, etc. | World Scientific Publishing Company, |
| Date of publication, distribution, etc. | 2005. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 224 p. ; |
| Dimensions | 25 cm. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Selected topics in electronics and systems. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | Impact ionization, avalanche and breakdown phenomena form the basis of many very interesting and important semiconductor devices, such as avalanche photodiodes, avalanche transistors, suppressors, sharpening diodes (diodes with delayed breakdown), as well as IMPATT and TRAPATT diodes. In order to provide maximal speed and power, many semiconductor devices must operate under or very close to breakdown conditions. Consequently, an acquaintance with breakdown phenomena is essential for scientists or engineers dealing with semiconductor devices. The aim of this book is to summarize the main experimental results on avalanche and breakdown phenomena in semiconductors and semiconductor devices and to analyze their features from a unified point of view. Attention is focused on the phenomenology of avalanche multiplication and the various kinds of breakdown phenomena and their qualitative analysis. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Levinshtein, Michael. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | Selected topics in electronics and systems. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Amazon.com |
| Uniform Resource Identifier | <a href="http://www.amazon.com/exec/obidos/ASIN/9812563954/chopaconline-20">http://www.amazon.com/exec/obidos/ASIN/9812563954/chopaconline-20</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Book |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Checked out | Date last seen | Date last checked out | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Air University Central Library Islamabad | Air University Central Library Islamabad | 02/23/2012 | 1 | 621.38152 BRE | P8913 | 10/23/2024 | 09/23/2024 | 09/23/2024 | 02/23/2012 | Book |