Semiconductor material and device characterization / (Record no. 14514)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02834nam a2200181 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | ASIN0471739065 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20190523072800.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 130206s2006 xxu eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0471739065 (hardcover) |
| Terms of availability | $178.00 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780471739067 (hardcover) |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Schroder, Dieter K. |
| 245 10 - TITLE STATEMENT | |
| Title | Semiconductor material and device characterization / |
| Statement of responsibility, etc. | Dieter K. Schroder. |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 3rd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | [S.l.] : |
| Name of publisher, distributor, etc. | Wiley-IEEE Press, |
| Date of publication, distribution, etc. | 2006. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 800 p. ; |
| Dimensions | 25 cm. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition , including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Amazon.com |
| Uniform Resource Identifier | <a href="http://www.amazon.com/exec/obidos/ASIN/0471739065/chopaconline-20">http://www.amazon.com/exec/obidos/ASIN/0471739065/chopaconline-20</a> |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
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| Dewey Decimal Classification | Department of Mechanical and Aerospace Engineering Library | Department of Mechanical and Aerospace Engineering Library | 02/05/2013 | 621.3815 SCH | IAAP000141 | 02/05/2013 | 02/05/2013 | Book |