Leakage in nanometer cmos technologies / Siva G. Narendra, Anantha P. Chandrakasan.

Contributor(s):

Material type: Text

TextSeries: Integrated circuits and systemsPublication details: [S.l.] : Springer, 2005.Edition: 1st edDescription: 317 p. ; 24 cmISBN:

0387257373 (hardcover)
9780387257372 (hardcover)

Online resources:

Amazon.com

Summary: Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Barcode
Book	Air University Central Library Islamabad	NFIC	621.38412 N1671L (Browse shelf(Opens below))	Available	P8914

Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.

There are no comments on this title.

to post a comment.

Welcome to Air University Central Library and Fazaia Medical College Library. (Sign in with Your email. Your user name is the same as your student ID number or Employee ID number for password, please contact Circulation Staff)

Leakage in nanometer cmos technologies / Siva G. Narendra, Anantha P. Chandrakasan.